Statistical Process Control (SPC) is an industry-standard methodology for measuring and controlling quality during the manufacturing process developed by XTS. Quality data in the form of Product or Process measurements are obtained in real-time during manufacturing. This data is then plotted on a graph with pre-determined control limits. Control limits are determined by the capability of the process, whereas specification limits are determined by the client's needs.

Business Objective:

•Collect measurement data automatically from measuring equipment of different makers

•Perform SPC analysis on measurement data with built-in SPC rule checking.

•Conform to audits of product quality data and method.

•Full traceability of quality control, quality inspection, measurement records.

•Real time alert of quality problems to production staff.

•Reduce rejects, product returns and warranty claims.

•Reduce human input mistake and eliminate erroneous paper method.

Connecting Meassuring Equipment:

•CMM Machine (Brown&Sharpe, Wenzel, Mitutoyo)

•Smartscope

•Moment of Inertia Meter

•Ping Test Signal Analyzer

•Weight Balance Meter

•C.O.G meter

•Force gauge

•Height gauge

•Marposs Machine

•Dial indicator

•Inductance Meter

•Resistance Meter

•Hi-pot tester

•Vernier caliper

•Micrometer

•Disc micrometer

•Radio meter

•Air gauge

•Customize measuring machines
 

XTRON OEE System is XTS own brand develop system product so we can provide to various country such as: